Relative Intensity Noise Characteristics of Long-Wavelength Quantum Dot Vertical-Cavity Surface-Emitting Lasers

doi:10.1143/JJAP.47.6357

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Peng, Peng-Chun	en_US
dc.contributor.author	Yeh, Chao-En	en_US
dc.contributor.author	Kuo, Hao-Chung	en_US
dc.contributor.author	Xuan, Ron	en_US
dc.contributor.author	Lin, Chun-Ting	en_US
dc.contributor.author	Lin, Gray	en_US
dc.contributor.author	Chi, Sien	en_US
dc.contributor.author	Chi, Jim Y.	en_US
dc.date.accessioned	2014-12-08T15:11:06Z	-
dc.date.available	2014-12-08T15:11:06Z	-
dc.date.issued	2008-08-01	en_US
dc.identifier.issn	0021-4922	en_US
dc.identifier.uri	http://dx.doi.org/10.1143/JJAP.47.6357	en_US
dc.identifier.uri	http://hdl.handle.net/11536/8504	-
dc.description.abstract	In the study we experimentally investigated the relative intensity noise (RIN) characteristics of a quantum-dot vertical-cavity surface-emitting laser (QD VCSEL). The single-mode QD VCSEL grown on a GaAs substrate is a fully doped structure. Additionally. the resonance frequency of the QD VCSEL with external light injection is as high as 19.2 GHz.	en_US
dc.language.iso	en_US	en_US
dc.subject	quantum dots	en_US
dc.subject	vertical-cavity surface-emitting laser	en_US
dc.subject	relative intensity noise	en_US
dc.title	Relative Intensity Noise Characteristics of Long-Wavelength Quantum Dot Vertical-Cavity Surface-Emitting Lasers	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1143/JJAP.47.6357	en_US
dc.identifier.journal	JAPANESE JOURNAL OF APPLIED PHYSICS	en_US
dc.citation.volume	47	en_US
dc.citation.issue	8	en_US
dc.citation.spage	6357	en_US
dc.citation.epage	6358	en_US
dc.contributor.department	電子物理學系	zh_TW
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	Department of Electrophysics	en_US
dc.contributor.department	Department of Photonics	en_US
dc.identifier.wosnumber	WOS:000260003000036	-
dc.citation.woscount	3	-
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