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dc.contributor.authorChang, Wen-Haoen_US
dc.contributor.authorLiao, Yu-Anen_US
dc.contributor.authorHsu, Wei-Tingen_US
dc.contributor.authorLee, Ming-Chihen_US
dc.contributor.authorChiu, Pei-Chinen_US
dc.contributor.authorChyi, Jen-Innen_US
dc.date.accessioned2014-12-08T15:11:10Z-
dc.date.available2014-12-08T15:11:10Z-
dc.date.issued2008-07-21en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.2964191en_US
dc.identifier.urihttp://hdl.handle.net/11536/8560-
dc.description.abstractCarrier dynamics of InAs/GaAs quantum dots (QDs) covered by a thin GaAs(1-x)Sb(x) layer were investigated by time-resolved photoluminescence (PL). Both the power dependence of PL peak shift and the long decay time constants confirm the type-II band alignment at the GaAsSb-InAs interface. Different recombination paths have been clarified by temperature dependent measurements. At lower temperatures, the long-range recombination between the QD electrons and the holes trapped by localized states in the GaAsSb layer is important, resulting in a non-single-exponential decay. At higher temperatures, optical transitions are dominated by the short-range recombination with the holes confined to the band-bending region surrounding the QDs. (C) 2008 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleCarrier dynamics of type-II InAs/GaAs quantum dots covered by a thin GaAs(1-x)Sb(x) layeren_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.2964191en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume93en_US
dc.citation.issue3en_US
dc.citation.epageen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000257968700068-
dc.citation.woscount24-
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