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dc.contributor.authorWijers, C. M. J.en_US
dc.contributor.authorVoskoboynikov, O.en_US
dc.date.accessioned2014-12-08T15:01:11Z-
dc.date.available2014-12-08T15:01:11Z-
dc.date.issued2008en_US
dc.identifier.isbn978-0-87849-471-2en_US
dc.identifier.issn1022-6680en_US
dc.identifier.urihttp://hdl.handle.net/11536/86-
dc.description.abstractIn a hybrid discrete-continuum description the optical response of a capped monolayer of nano-objects has been determined. The monolayer emits a summation of partial plane waves obeying traditional reflection and transmission, enabling solution of the monolayer dipole strength. For thick capping layers the resulting reflection coefficients could be approximated by analytical expressions. These results have been used to investigate the feasibility of experimental detection of the optical response of nano-object monolayers.en_US
dc.language.isoen_USen_US
dc.subjectopticsen_US
dc.subjectnano-objectsen_US
dc.subjectembeddingen_US
dc.titleOptical reflection from a monolayer of embedded nano-objects covered by a thick capping layeren_US
dc.typeProceedings Paperen_US
dc.identifier.journalSEMICONDUCTOR PHOTONICS: NANO-STRUCTURED MATERIALS AND DEVICESen_US
dc.citation.volume31en_US
dc.citation.spage52en_US
dc.citation.epage55en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000254169500015-
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