Full metadata record
DC FieldValueLanguage
dc.contributor.authorChen, Y. F.en_US
dc.contributor.authorHuang, Y. J.en_US
dc.contributor.authorChiang, P. Y.en_US
dc.contributor.authorLin, Y. C.en_US
dc.contributor.authorLiang, H. C.en_US
dc.date.accessioned2014-12-08T15:11:28Z-
dc.date.available2014-12-08T15:11:28Z-
dc.date.issued2011-06-01en_US
dc.identifier.issn0946-2171en_US
dc.identifier.urihttp://dx.doi.org/10.1007/s00340-010-4293-2en_US
dc.identifier.urihttp://hdl.handle.net/11536/8804-
dc.description.abstractA short-cavity Nd:YVO(4) laser is employed to confirm that a spontaneous mode locking (SML) typically occurs without employing an extra nonlinearity. We further experimentally demonstrate that reducing the number of longitudinal lasing modes can diminish the phase fluctuation and effectively improve the SML pulse stability. Considering the spatial hole-burning (SHB) effect, an analytical expression is derived to accurately estimate the number of longitudinal lasing modes for a practical design guideline.en_US
dc.language.isoen_USen_US
dc.titleControlling number of lasing modes for designing short-cavity self-mode-locked Nd-doped vanadate lasersen_US
dc.typeArticleen_US
dc.identifier.doi10.1007/s00340-010-4293-2en_US
dc.identifier.journalAPPLIED PHYSICS B-LASERS AND OPTICSen_US
dc.citation.volume103en_US
dc.citation.issue4en_US
dc.citation.spage841en_US
dc.citation.epage846en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000291996400012-
dc.citation.woscount6-
Appears in Collections:Articles


Files in This Item:

  1. 000291996400012.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.