Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chen, C. C. | en_US |
dc.contributor.author | Chen, Y. C. | en_US |
dc.contributor.author | Chen, Chin-Ta | en_US |
dc.contributor.author | Hsiao, Hsu-Liang | en_US |
dc.contributor.author | Chang, Chia-Chi | en_US |
dc.contributor.author | Cheng, Y. T. | en_US |
dc.contributor.author | Wu, Mount-Learn | en_US |
dc.date.accessioned | 2014-12-08T15:11:35Z | - |
dc.date.available | 2014-12-08T15:11:35Z | - |
dc.date.issued | 2011-05-01 | en_US |
dc.identifier.issn | 1077-260X | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/JSTQE.2010.2090037 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/8894 | - |
dc.description.abstract | This paper introduces a method combining a general electrothermal network p-model in system level and the associated mathematical technique, Green's theorem, in terms of the adopted materials and system geometries to build up an equivalent electrothermal circuit model (EETCM) for efficient thermal analysis and behavior prediction in a thermal system. Heat conduction and convection equations in integral forms are derived using the theorem and successfully applied for the thermal analysis of a 3-D optical stack, vertical-cavity surface-emitting lasers (VCSELs) on a silicon optical bench. The complex stack structure in conventional simulators can be greatly simplified using the method by well-predicting probable heat flow paths, and the simplification can eventually achieve the goal of CPU time saving without having complicated mesh designing or scaling. By comparing the data from the measurement, the finite-element simulation, and the method calculation shows that an excellent temperature match within +/-similar to 0.5 degrees C and 90% CPU time saving can be realized. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | 3-D optical stacks | en_US |
dc.subject | Green's theorem | en_US |
dc.subject | conduction | en_US |
dc.subject | convection | en_US |
dc.subject | equivalent electrothermal circuit model (EETCM) | en_US |
dc.subject | general electrothermal network pi-model | en_US |
dc.subject | heat transfer equation | en_US |
dc.subject | silicon optical bench (SiOB) | en_US |
dc.subject | thermal management | en_US |
dc.subject | vertical-cavity surface-emitting laser (VCSEL) | en_US |
dc.title | Thermal Analysis: VCSELs on an SiOB | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/JSTQE.2010.2090037 | en_US |
dc.identifier.journal | IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS | en_US |
dc.citation.volume | 17 | en_US |
dc.citation.issue | 3 | en_US |
dc.citation.spage | 531 | en_US |
dc.citation.epage | 539 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000291403100006 | - |
dc.citation.woscount | 1 | - |
Appears in Collections: | Articles |
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