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dc.contributor.authorKatkov, A. V.en_US
dc.contributor.authorWang, C. C.en_US
dc.contributor.authorChi, J. Y.en_US
dc.contributor.authorCheng, C.en_US
dc.contributor.authorGutakovskii, A. K.en_US
dc.date.accessioned2014-12-08T15:11:35Z-
dc.date.available2014-12-08T15:11:35Z-
dc.date.issued2011-05-01en_US
dc.identifier.issn1071-1023en_US
dc.identifier.urihttp://dx.doi.org/10.1116/1.3570870en_US
dc.identifier.urihttp://hdl.handle.net/11536/8896-
dc.description.abstractAn order-of-magnitude increase of photoluminescence (PL) efficiency at room temperature has been observed in the GaAs/InAs quantum dots (QDs)-in-a-well structure grown with in situ irradiation of atomic hydrogen supplied by a radio-frequency hydrogen-plasma source. The enhancement in PL intensity rapidly increases with the hydrogen flow rate and is stable with a variation of excitation power in the radio-frequency plasma source. Extensive thermal annealing of grown samples up to 634 degrees C did not show any significant degradation of photoluminescence intensity compared with the reference sample. The reduction of nonradiative recombination centers in the as-grown sample causes the greatly enhanced luminescence property. In addition to PL enhancement the authors observed that the H-assisted growth of InAs QDs has suppressed bimodal distribution of QD shape. In contrast to the hydrogen-plasma-assisted growth, irradiation by hydrogen in molecular form has a detrimental effect on the optical properties of similar structures. The high thermal stability of improved optical properties suggests that the formation of the defects which are responsible for nonradiative recombination channels is suppressed during H-assisted epitaxy although in situ defect passivation by atomic hydrogen cannot be completely ruled out. (C) 2011 American Vacuum Society. [DOI: 10.1116/1.3570870]en_US
dc.language.isoen_USen_US
dc.titleOptical property improvement of InAs/GaAs quantum dots grown by hydrogen-plasma-assisted molecular beam epitaxyen_US
dc.typeArticleen_US
dc.identifier.doi10.1116/1.3570870en_US
dc.identifier.journalJOURNAL OF VACUUM SCIENCE & TECHNOLOGY Ben_US
dc.citation.volume29en_US
dc.citation.issue3en_US
dc.citation.epageen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000291111300063-
dc.citation.woscount2-
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