完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Lin, Ya-Ti | en_US |
dc.contributor.author | Yang, Yeou-Herng | en_US |
dc.contributor.author | Kang, Jin-Su | en_US |
dc.contributor.author | Yu, Hsiao-Cheng | en_US |
dc.date.accessioned | 2014-12-08T15:11:43Z | - |
dc.date.available | 2014-12-08T15:11:43Z | - |
dc.date.issued | 2011-05-01 | en_US |
dc.identifier.issn | 0957-4174 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1016/j.eswa.2010.11.092 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/8981 | - |
dc.description.abstract | The booming of Integrated Circuit (IC) design service has become a critical sub-industry to the evolution of semiconductor industry. In this paper, we took the case of a tier one IC design service company to explore the core competences of this emerging industry. Seven core competences are defined throughout the research. More specifically, this paper analyzes the in-depth of the interrelation among the core competences by utilizing the DEMATEL method. They are divided into causal and effect groups, enabling readers to gain a better understanding of the interactive relationship between them, as well as making suggestions for improvement to enhance their overall performance. The result has shown that the Intellectual Property (IP) design capability is the most important core competence. Enhancing five of the core competences in the causal group will improve the overall performance. Further, DEMATEL method is demonstrated as a useful approach in exploring the interrelationship. (c) 2010 Elsevier Ltd. All rights reserved. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | IC design service | en_US |
dc.subject | Core competence | en_US |
dc.subject | DEMATEL | en_US |
dc.subject | Semiconductor industry | en_US |
dc.title | Using DEMATEL method to explore the core competences and causal effect of the IC design service company: An empirical case study | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1016/j.eswa.2010.11.092 | en_US |
dc.identifier.journal | EXPERT SYSTEMS WITH APPLICATIONS | en_US |
dc.citation.volume | 38 | en_US |
dc.citation.issue | 5 | en_US |
dc.citation.spage | 6262 | en_US |
dc.citation.epage | 6268 | en_US |
dc.contributor.department | 經營管理研究所 | zh_TW |
dc.contributor.department | 科技管理研究所 | zh_TW |
dc.contributor.department | Institute of Business and Management | en_US |
dc.contributor.department | Institute of Management of Technology | en_US |
dc.identifier.wosnumber | WOS:000287419900182 | - |
dc.citation.woscount | 9 | - |
顯示於類別: | 期刊論文 |