| 標題: | Ⅲ-Ⅴ族薄膜和晶格無缺陷技術在高頻、光電元件的應用及3D矽積體電路的整合(II) The Applications of Defect-Free Tech. and Materials of Ⅲ-ⅤGroup in RF,Optical Electronic Devices and Integration in 3-D Si CMOS Circuits(II) |
| 作者: | 荊鳳德 CHIN ALBERT 交通大學電子工程系 |
| 公開日期: | 2006 |
| 官方說明文件#: | NSC95-2221-E009-275 |
| URI: | http://hdl.handle.net/11536/89824 https://www.grb.gov.tw/search/planDetail?id=1309507&docId=241989 |
| Appears in Collections: | Research Plans |
- Ⅲ-Ⅴ族薄膜和晶格無缺陷技術在高頻、光電元件的應用及3D矽積體電路的整合(III) / 荊鳳德;CHIN ALBERT
- Ⅲ-Ⅴ族薄膜和晶格無缺陷技術在高頻、光電元件的應用及3D矽積體電路的整合(I) / 荊鳳德;CHIN ALBERT
- Design of Compact ESD Protection Circuit for V-Band RF Applications in a 65-nm CMOS Technology / Lin, Chun-Yu;Chu, Li-Wei;Tsai, Shiang-Yu;Ker, Ming-Dou
- Low-K/Cu CMOS-based SoC technology with 115-GHz f(T), 100-GHz f(max), noise 80-nm RF CMOS, high-Q MiM capacitor, and spiral Cu inductor / Guo, Jyh-Chyurn
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