CMOS玻璃蓋片視覺檢測系統與瑕疵分類方法之研究(II)

Full metadata record

DC Field	Value	Language
dc.contributor.author	彭德保	en_US
dc.contributor.author	PERNG DER-BAAU	en_US
dc.date.accessioned	2014-12-13T10:29:58Z	-
dc.date.available	2014-12-13T10:29:58Z	-
dc.date.issued	2006	en_US
dc.identifier.govdoc	NSC95-2221-E009-140	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/89857	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=1309086&docId=241877	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.language.iso	zh_TW	en_US
dc.title	CMOS玻璃蓋片視覺檢測系統與瑕疵分類方法之研究(II)	zh_TW
dc.title	The Researches of Defect Inspeciton and Classification of the CMOS Glass Lid (II)	en_US
dc.type	Plan	en_US
dc.contributor.department	國立交通大學工業工程與管理學系(所)	zh_TW
Appears in Collections:	Research Plans