完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Liu, Suet-Yi | en_US |
dc.contributor.author | Alnama, Koutayba | en_US |
dc.contributor.author | Matsumoto, Jun | en_US |
dc.contributor.author | Nishizawa, Kiyoshi | en_US |
dc.contributor.author | Kohguchi, Hiroshi | en_US |
dc.contributor.author | Lee, Yuan-Pern | en_US |
dc.contributor.author | Suzuki, Toshinori | en_US |
dc.date.accessioned | 2014-12-08T15:11:44Z | - |
dc.date.available | 2014-12-08T15:11:44Z | - |
dc.date.issued | 2011-04-14 | en_US |
dc.identifier.issn | 1089-5639 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1021/jp1098574 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/9000 | - |
dc.description.abstract | We performed He I ultraviolet photoelectron spectroscopy (UPS) of jet-cooled aromatic molecules using a newly developed photoelectron imaging (PEI) spectrometer. The PEI spectrometer can measure photoelectron spectra and photoelectron angular distributions at a considerably higher efficiency than a conventional spectrometer that uses a hemispherical energy analyzer. One technical problem with PEI is its relatively high susceptibility to background electrons generated by scattered He I radiation. To reduce this problem, we designed a new electrostatic lens that intercepts background photoelectrons emitted from the repeller plate toward the imaging detector. An energy resolution (Delta E/E) of 0.735% at E = 5.461 eV is demonstrated with He I radiation. The energy resolution is limited by the size of the ionization region. Trajectory calculations indicate that the system is capable of achieving an energy resolution of 0.04% with a laser if the imaging resolution is not limited. Experimental results are presented for jet-cooled benzene and pyridine, and they are compared with results in the literature. | en_US |
dc.language.iso | en_US | en_US |
dc.title | He I Ultraviolet Photoelectron Spectroscopy of Benzene and Pyridine in Supersonic Molecular Beams Using Photoelectron Imaging | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1021/jp1098574 | en_US |
dc.identifier.journal | JOURNAL OF PHYSICAL CHEMISTRY A | en_US |
dc.citation.volume | 115 | en_US |
dc.citation.issue | 14 | en_US |
dc.citation.spage | 2953 | en_US |
dc.citation.epage | 2965 | en_US |
dc.contributor.department | 應用化學系 | zh_TW |
dc.contributor.department | Department of Applied Chemistry | en_US |
dc.identifier.wosnumber | WOS:000289215500006 | - |
dc.citation.woscount | 13 | - |
顯示於類別: | 期刊論文 |