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dc.contributor.authorLiu, Suet-Yien_US
dc.contributor.authorAlnama, Koutaybaen_US
dc.contributor.authorMatsumoto, Junen_US
dc.contributor.authorNishizawa, Kiyoshien_US
dc.contributor.authorKohguchi, Hiroshien_US
dc.contributor.authorLee, Yuan-Pernen_US
dc.contributor.authorSuzuki, Toshinorien_US
dc.date.accessioned2014-12-08T15:11:44Z-
dc.date.available2014-12-08T15:11:44Z-
dc.date.issued2011-04-14en_US
dc.identifier.issn1089-5639en_US
dc.identifier.urihttp://dx.doi.org/10.1021/jp1098574en_US
dc.identifier.urihttp://hdl.handle.net/11536/9000-
dc.description.abstractWe performed He I ultraviolet photoelectron spectroscopy (UPS) of jet-cooled aromatic molecules using a newly developed photoelectron imaging (PEI) spectrometer. The PEI spectrometer can measure photoelectron spectra and photoelectron angular distributions at a considerably higher efficiency than a conventional spectrometer that uses a hemispherical energy analyzer. One technical problem with PEI is its relatively high susceptibility to background electrons generated by scattered He I radiation. To reduce this problem, we designed a new electrostatic lens that intercepts background photoelectrons emitted from the repeller plate toward the imaging detector. An energy resolution (Delta E/E) of 0.735% at E = 5.461 eV is demonstrated with He I radiation. The energy resolution is limited by the size of the ionization region. Trajectory calculations indicate that the system is capable of achieving an energy resolution of 0.04% with a laser if the imaging resolution is not limited. Experimental results are presented for jet-cooled benzene and pyridine, and they are compared with results in the literature.en_US
dc.language.isoen_USen_US
dc.titleHe I Ultraviolet Photoelectron Spectroscopy of Benzene and Pyridine in Supersonic Molecular Beams Using Photoelectron Imagingen_US
dc.typeArticleen_US
dc.identifier.doi10.1021/jp1098574en_US
dc.identifier.journalJOURNAL OF PHYSICAL CHEMISTRY Aen_US
dc.citation.volume115en_US
dc.citation.issue14en_US
dc.citation.spage2953en_US
dc.citation.epage2965en_US
dc.contributor.department應用化學系zh_TW
dc.contributor.departmentDepartment of Applied Chemistryen_US
dc.identifier.wosnumberWOS:000289215500006-
dc.citation.woscount13-
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