Applying Expert Diagnosis Model to Collaborative Design Systems

doi:10.1166/asl.2011.1485

標題:	Applying Expert Diagnosis Model to Collaborative Design Systems
作者:	Wu, Cheng-Ru Chang, Che-Wei Chen, Chiu-Chin 資訊管理與財務金融系註：原資管所+財金所 Department of Information Management and Finance
關鍵字:	TFT-LCD Industry;AMS;GRA;Collaborative Design System
公開日期:	1-四月-2011
摘要:	Thin film transistor liquid crystal display (TFT-LCD) industry need to control the development budget. The alarm management system (AMS) can test machine alarm. This study uses the grey relational analysis (GRA) the expert evaluation model to measure software quality management system of alarm in order to reduce system failures.
URI:	http://dx.doi.org/10.1166/asl.2011.1485 http://hdl.handle.net/11536/9016
ISSN:	1936-6612
DOI:	10.1166/asl.2011.1485
期刊:	ADVANCED SCIENCE LETTERS
Volume:	4
Issue:	4-5
起始頁:	1860
結束頁:	1861
顯示於類別：	期刊論文