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近場光聲顯微術在奈米尺度異結構殘留應力的量測研究(II)
近場光聲顯微術在奈米尺度異結構殘留應力的量測研究(II)
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932212E009007.pdf
(317.37 KB)
Date
2004
Authors
尹慶中
YIN CHING-CHUNG
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https://www.grb.gov.tw/search/planDetail?id=984813&docId=183789
https://ir.lib.nycu.edu.tw/handle/11536/91080
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