近場光聲顯微術在奈米尺度異結構殘留應力的量測研究(II)

標題:	近場光聲顯微術在奈米尺度異結構殘留應力的量測研究(II) Determination of Residual Stresses in Nanometer Scale Heterosturctures Using Near-field Photoacoustic Microscopy(II)
作者:	尹慶中 YIN CHING-CHUNG 交通大學機械工程系
公開日期:	2004
官方說明文件#:	NSC93-2212-E009-007
URI:	http://hdl.handle.net/11536/91080 https://www.grb.gov.tw/search/planDetail?id=984813&docId=183789
Appears in Collections:	Research Plans

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