Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lin, Chen-ju | en_US |
dc.contributor.author | Pearn, Wen Lea | en_US |
dc.date.accessioned | 2014-12-08T15:11:52Z | - |
dc.date.available | 2014-12-08T15:11:52Z | - |
dc.date.issued | 2011-04-01 | en_US |
dc.identifier.issn | 0378-3758 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1016/j.jspi.2010.11.013 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/9109 | - |
dc.description.abstract | Producing qualified items or products is essential to meet the requirement preset by customers. Evaluation and selection of desired manufacturing lines become challenging tasks for decision makers. Production yield is one of the important factors in measuring production performance. The goal of this paper is to screen a group of manufacturing lines and identify the best one with the highest yield. For the production lines with extremely low fraction of defectives, the yield index, S(pk), is an efficient indicator for quality level. This paper considers the production selection problem by using S(pk) to compare k (k > 2) manufacturing lines. A subset is constructed to contain the production lines with the highest yield. A systematic approach of test order k compares selected pairs of manufacturing lines along with the Bonferroni method is proposed to solve this problem. Each pair of production yields is compared by taking ratio. The paper provides critical values and required sample sizes of the group selection procedure. An application example on evaluating four power inductor productions is presented to illustrate the practicality of the proposed approach. (C) 2010 Elsevier B.V. All rights reserved. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Group selection | en_US |
dc.subject | Production yield | en_US |
dc.subject | Quality management | en_US |
dc.subject | Bonferroni method | en_US |
dc.title | Group selection for production yield among k manufacturing lines | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1016/j.jspi.2010.11.013 | en_US |
dc.identifier.journal | JOURNAL OF STATISTICAL PLANNING AND INFERENCE | en_US |
dc.citation.volume | 141 | en_US |
dc.citation.issue | 4 | en_US |
dc.citation.spage | 1510 | en_US |
dc.citation.epage | 1518 | en_US |
dc.contributor.department | 工業工程與管理學系 | zh_TW |
dc.contributor.department | Department of Industrial Engineering and Management | en_US |
dc.identifier.wosnumber | WOS:000286960500014 | - |
dc.citation.woscount | 3 | - |
Appears in Collections: | Articles |
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