統計資料
總造訪次數
| 檢視 | |
|---|---|
| Field Dependence of Porous Low-k Dielectric Breakdown as Revealed by the Effects of Line Edge Roughness on Failure Distributions | 115 |
本月總瀏覽
| 七月 2024 | 八月 2024 | 九月 2024 | 十月 2024 | 十一月 2024 | 十二月 2024 | 一月 2025 | |
|---|---|---|---|---|---|---|---|
| Field Dependence of Porous Low-k Dielectric Breakdown as Revealed by the Effects of Line Edge Roughness on Failure Distributions | 1 | 0 | 0 | 0 | 0 | 1 | 0 |
檔案下載
| 檢視 |
|---|
國家瀏覽排行
| 檢視 | |
|---|---|
| 中國 | 96 |
| 美國 | 13 |
| 愛爾蘭 | 2 |
| 比利時 | 1 |
| 印度 | 1 |
| 烏克蘭 | 1 |
縣市瀏覽排行
| 檢視 | |
|---|---|
| Shenzhen | 95 |
| Menlo Park | 6 |
| Kensington | 4 |
| Beijing | 1 |
| Edmond | 1 |
| Heverlee | 1 |
| Kirksville | 1 |
| Kiselëv | 1 |
| Troy | 1 |