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dc.contributor.authorZan, Hsiao-Wenen_US
dc.contributor.authorLiang, Yun-Chiaen_US
dc.contributor.authorTsai, Wuu-Weien_US
dc.contributor.authorYang, Yuh-Shyongen_US
dc.date.accessioned2014-12-08T15:12:07Z-
dc.date.available2014-12-08T15:12:07Z-
dc.date.issued2007en_US
dc.identifier.isbn978-957-28522-4-8en_US
dc.identifier.urihttp://hdl.handle.net/11536/9290-
dc.description.abstractThe ammonia gas sensing behaviors of pentacene-based organic thin-film transistors were characterized by analyzing parameters such as the threshold voltage, the field-effect mobility and the subthreshold swing. It was firstly found that the bias-induced carriers strongly enhanced the gas sensing. Bias-stress model successfully explained the experimental results. The ammonia-induced threshold voltage shift was probable due to the generation of nitrogen- or hydrogen-related defect states in the pentacene film.en_US
dc.language.isoen_USen_US
dc.titleGas sensing mechanism in pentacene-based OTFTsen_US
dc.typeProceedings Paperen_US
dc.identifier.journalIDMC'07: PROCEEDINGS OF THE INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE 2007en_US
dc.citation.spage544en_US
dc.citation.epage546en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000258177700141-
Appears in Collections:Conferences Paper