建構積體電路之多特性多量測點資料之管制流程

Full metadata record

DC Field	Value	Language
dc.contributor.author	唐麗英	en_US
dc.contributor.author	TONG LEE-ING	en_US
dc.date.accessioned	2014-12-13T10:36:02Z	-
dc.date.available	2014-12-13T10:36:02Z	-
dc.date.issued	2000	en_US
dc.identifier.govdoc	NSC89-2213-E009-169	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/93719	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=566994&docId=105512	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.language.iso	zh_TW	en_US
dc.title	建構積體電路之多特性多量測點資料之管制流程	zh_TW
dc.title	Statistical Monitoring Procedure for Multiple Readings of Quality Characteristics for Integrated Circuits Fabrication	en_US
dc.type	Plan	en_US
dc.contributor.department	國立交通大學工業工程與管理學系	zh_TW
Appears in Collections:	Research Plans

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