Title: | The post-annealing effect on the electrical properties of pentacene thin film transistors |
Authors: | Shih, Yin-Ting Chen, Fang-Chung 光電工程學系 Department of Photonics |
Issue Date: | 2007 |
Abstract: | In this study, the effect of post-annealing on the device performance is investigated systematically. X-ray diffraction pattern and images of atomic force microscopy reveal that the pentacene grain grows larger and the grain boundaries reduces after thermal annealing, resulting in the enhancement of device performance and stability. |
URI: | http://hdl.handle.net/11536/9412 |
ISBN: | 978-957-28522-4-8 |
Journal: | IDMC'07: PROCEEDINGS OF THE INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE 2007 |
Begin Page: | 709 |
End Page: | 712 |
Appears in Collections: | Conferences Paper |