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dc.contributor.author詹世雄en_US
dc.date.accessioned2014-12-13T10:36:47Z-
dc.date.available2014-12-13T10:36:47Z-
dc.date.issued1999en_US
dc.identifier.govdocNSC88-2215-E317-010zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/94168-
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=444393&docId=80487en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.language.isozh_TWen_US
dc.subject複晶矽zh_TW
dc.subject薄膜電晶體zh_TW
dc.subject鈍化zh_TW
dc.subject可靠度zh_TW
dc.subjectPolysiliconen_US
dc.subjectThin film transistoren_US
dc.subjectPassivationen_US
dc.subjectReliabilityen_US
dc.title子計畫IV:超高真空化學氣相沈積低溫複晶矽薄膜電晶體之鈍化與可靠度的研究zh_TW
dc.typePlanen_US
dc.contributor.department國立交通大學毫微米實驗室zh_TW
顯示於類別:研究計畫