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dc.contributor.author陸懋宏en_US
dc.date.accessioned2014-12-13T10:38:28Z-
dc.date.available2014-12-13T10:38:28Z-
dc.date.issued1997en_US
dc.identifier.govdocNSC86-2215-E009-015zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/95419-
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=271946&docId=48510en_US
dc.description.abstract本計劃將利用純量繞射理論來設計反射式二元光學繞射元件,並利用製造穿透式二元光學繞射元件的半導體製程技術 活性離子蝕刻 ( reactive ion etching ; 簡稱RIE ) 技術來製造反射式二元光學繞射元件。計算出固定孔徑下,入、反射角度所對應的最小環帶寬度,以及分析製程誤差所引入的繞射效率變化。建立量測反射式二元光學繞射元件之光強分布及繞射效率的量測系統,並對製造出的八階反射式二元光學繞射元件進行效能的量測,並將結果與理論計算值相比對。zh_TW
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.language.isozh_TWen_US
dc.subject菲涅耳透鏡zh_TW
dc.subject二元微透鏡zh_TW
dc.subject微光學器件zh_TW
dc.subject溼蝕刻zh_TW
dc.subject活性離子蝕刻zh_TW
dc.subjectFresnel lenen_US
dc.subjectBinary microlenen_US
dc.subjectMicrooptical elementen_US
dc.subjectWet etchingen_US
dc.subjectReactive ion etchingen_US
dc.title以石英或玻璃為基片之二元微透鏡的設計與製作zh_TW
dc.titleDesigns and Fabrications of Binary Microlens with Quartz or Glass Substrateen_US
dc.typePlanen_US
dc.contributor.department交通大學光電工程研究所zh_TW
Appears in Collections:Research Plans