超快掃描探針式顯微術及其應用之研究

Title:	超快掃描探針式顯微術及其應用之研究 Ultrafast Scanning Probe Microscopies and Applications
Authors:	潘犀靈 CI-LINGPAN 交通大學光電工程研究所
Keywords:	近場;光學顯微術;時間序列分析;光譜分析;Near field;Optical microscopy;Time series analysis;Spectrum analysis
Issue Date:	1997
Gov't Doc #:	NSC86-2811-E009-001
URI:	http://hdl.handle.net/11536/95490 https://www.grb.gov.tw/search/planDetail?id=278672&docId=50170
Appears in Collections:	Research Plans