完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | 鍾淑馨 | en_US |
dc.contributor.author | CHUNG SHU-HSING | en_US |
dc.date.accessioned | 2014-12-13T10:38:52Z | - |
dc.date.available | 2014-12-13T10:38:52Z | - |
dc.date.issued | 1996 | en_US |
dc.identifier.govdoc | NSC85-2213-E009-055 | zh_TW |
dc.identifier.uri | http://hdl.handle.net/11536/95828 | - |
dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=208488&docId=37002 | en_US |
dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
dc.language.iso | zh_TW | en_US |
dc.subject | 生產規劃系統 | zh_TW |
dc.subject | 批量大小規劃 | zh_TW |
dc.subject | 動態式工件到達 | zh_TW |
dc.subject | 半導體測試作業 | zh_TW |
dc.subject | 前瞻式方法 | zh_TW |
dc.subject | Production planning system | en_US |
dc.subject | Lot size planning | en_US |
dc.subject | Dynamic jobs arrival pattern | en_US |
dc.subject | Semiconductor testing operation | en_US |
dc.subject | Lookahead method | en_US |
dc.title | 半導體測試區生產排程系統之構建 | zh_TW |
dc.title | The Construction of Production Scheduling System for Semiconductor Testing Area | en_US |
dc.type | Plan | en_US |
dc.contributor.department | 國立交通大學工業工程與管理學系 | zh_TW |
顯示於類別: | 研究計畫 |