掃描探針式電子穿透顯微鏡組裝及表面物理研究(I)

Full metadata record

DC Field	Value	Language
dc.contributor.author	林登松	en_US
dc.contributor.author	DENG-SUNGLIN	en_US
dc.date.accessioned	2014-12-13T10:39:45Z	-
dc.date.available	2014-12-13T10:39:45Z	-
dc.date.issued	1995	en_US
dc.identifier.govdoc	NSC84-2112-M009-031	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/96782	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=160902&docId=26759	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.language.iso	zh_TW	en_US
dc.title	掃描探針式電子穿透顯微鏡組裝及表面物理研究(I)	zh_TW
dc.title	Study of Semiconductor Surface and Thin Film Physics Using Ultra-High Vacuum Scanning Tunneling Microscopy (I)	en_US
dc.type	Plan	en_US
dc.contributor.department	國立交通大學物理研究所	zh_TW
Appears in Collections:	Research Plans