Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Cheng, Shiau-Shin | en_US |
dc.contributor.author | Yang, Chuan-Yi | en_US |
dc.contributor.author | Ou, Chun-Wei | en_US |
dc.contributor.author | Chuang, You-Che | en_US |
dc.contributor.author | Wu, Meng-Chyi | en_US |
dc.contributor.author | Chu, Chih-Wei | en_US |
dc.date.accessioned | 2014-12-08T15:12:52Z | - |
dc.date.available | 2014-12-08T15:12:52Z | - |
dc.date.issued | 2008 | en_US |
dc.identifier.issn | 1099-0062 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/9921 | - |
dc.identifier.uri | http://dx.doi.org/10.1149/1.2844285 | en_US |
dc.description.abstract | Pentacene thin-film transistors operated at low voltages have been realized by employing hybrid dielectrics, poly(4-vinylphenol) (PVP)-capped MgO. The MgO film was deposited by reactive evaporation of magnesium in oxygen. The PVP layer plays a role in modifying the surface morphology of the MgO layer, and the images of atomic force microscopy for the PVP-capped MgO films show a root-mean-square roughness of 1 nm. The hybrid dielectric has a dielectric constant of 7.05 with a dielectric strength. The fabricated pentacene organic thin-film transistors exhibit a mobility of 0.66 cm(2)/V s, a threshold voltage of -2.67 V, and an on/off ratio of 10(3). (c) 2008 The Electrochemical Society. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Pentacene thin-film transistor with PVP-capped high-k MgO dielectric grown by reactive evaporation | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1149/1.2844285 | en_US |
dc.identifier.journal | ELECTROCHEMICAL AND SOLID STATE LETTERS | en_US |
dc.citation.volume | 11 | en_US |
dc.citation.issue | 5 | en_US |
dc.citation.spage | H118 | en_US |
dc.citation.epage | H120 | en_US |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | Department of Photonics | en_US |
dc.identifier.wosnumber | WOS:000253989800020 | - |
dc.citation.woscount | 7 | - |
Appears in Collections: | Articles |