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dc.contributor.authorChin, Wen-Longen_US
dc.contributor.authorChen, Sau-Geeen_US
dc.date.accessioned2014-12-08T15:12:54Z-
dc.date.available2014-12-08T15:12:54Z-
dc.date.issued2008en_US
dc.identifier.issn1687-6172en_US
dc.identifier.urihttp://hdl.handle.net/11536/9945-
dc.identifier.urihttp://dx.doi.org/10.1155/2008/840237en_US
dc.description.abstractThe majority of existing analyses on synchronization errors consider only partial synchronization error factors. In contrast, this work simultaneously analyzes joint effects of major synchronization errors, including the symbol time offset (STO), carrier frequency offset (CFO), and sampling clock frequency offset (SCFO) of orthogonal frequency-division multiplexing (OFDM) systems in doubly-selective fading channels. Those errors are generally coexisting so that the combined error will seriously degrade the performance of an OFDM receiver by introducing intercarrier interference (ICI) and intersymbol interference (ISI). To assist the design of OFDM receivers, we formulate the theoretical signal-to-interference-and-noise ratio (SINR) due to the combined error effect. As such, by knowing the required SINR of a specific application, all combinations of allowable errors can be derived, and cost-effective algorithms can be easily characterized. By doing so, it is unnecessary to run the time-consuming Monte Carlo simulations, commonly adopted by many conventional designs of synchronization algorithms, in order to know those combined error effects. Copyright (C) 2008 W.- L. Chin and S.-G. Chen.en_US
dc.language.isoen_USen_US
dc.titleJoint Effects of Synchronization Errors of OFDM Systems in Doubly-Selective Fading Channelsen_US
dc.typeArticleen_US
dc.identifier.doi10.1155/2008/840237en_US
dc.identifier.journalEURASIP JOURNAL ON ADVANCES IN SIGNAL PROCESSINGen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000263439300001-
dc.citation.woscount2-
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