Enhanced performance and reliability for solid-phase crystallized poly-Si TFTs with argon ion implantation (vol 154, pg J375, 2007)

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DC Field	Value	Language
dc.contributor.author	Chang, Chia-Wen	en_US
dc.contributor.author	Deng, Chih-Kang	en_US
dc.contributor.author	Chang, Che-Lun	en_US
dc.contributor.author	Lei, Tan-Fu	en_US
dc.date.accessioned	2014-12-08T15:12:56Z	-
dc.date.available	2014-12-08T15:12:56Z	-
dc.date.issued	2008	en_US
dc.identifier.issn	0013-4651	en_US
dc.identifier.uri	http://hdl.handle.net/11536/9979	-
dc.identifier.uri	http://dx.doi.org/10.1149/1.2821307	en_US
dc.language.iso	en_US	en_US
dc.title	Enhanced performance and reliability for solid-phase crystallized poly-Si TFTs with argon ion implantation (vol 154, pg J375, 2007)	en_US
dc.type	Correction	en_US
dc.identifier.doi	10.1149/1.2821307	en_US
dc.identifier.journal	JOURNAL OF THE ELECTROCHEMICAL SOCIETY	en_US
dc.citation.volume	155	en_US
dc.citation.issue	2	en_US
dc.citation.spage	S4	en_US
dc.citation.epage	S4	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:000251906800081	-
dc.citation.woscount	0	-
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