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OPTICAL AND RAMAN CORRELATION OF LASER RECRYSTALLIZED AND QUENCHED AMORPHOUS-SILICON FILM - A MICROPROBE STUDY

dc.citation.epage734en_US
dc.citation.issue6en_US
dc.citation.spage729en_US
dc.citation.volume23en_US
dc.citation.woscount1
dc.contributor.authorHUANG, CRen_US
dc.contributor.authorLEE, MCen_US
dc.contributor.authorCHANG, YSen_US
dc.contributor.authorLIN, CCen_US
dc.contributor.authorCHAO, YFen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:05:33Z
dc.date.available2014-12-08T15:05:33Z
dc.date.issued1990-06-14en_US
dc.identifier.doi10.1088/0022-3727/23/6/016en_US
dc.identifier.issn0022-3727en_US
dc.identifier.journalJOURNAL OF PHYSICS D-APPLIED PHYSICSen_US
dc.identifier.urihttp://dx.doi.org/10.1088/0022-3727/23/6/016en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/4082
dc.identifier.wosnumberWOS:A1990DH35000016
dc.language.isoen_USen_US
dc.titleOPTICAL AND RAMAN CORRELATION OF LASER RECRYSTALLIZED AND QUENCHED AMORPHOUS-SILICON FILM - A MICROPROBE STUDYen_US
dc.typeArticleen_US

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