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Computer program for calculating the p-value in testing process capability index C-pmk

dc.citation.epage342en_US
dc.citation.issue4en_US
dc.citation.spage333en_US
dc.citation.volume18en_US
dc.citation.woscount20
dc.contributor.authorPearn, WLen_US
dc.contributor.authorLin, PCen_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.date.accessioned2014-12-08T15:42:16Z
dc.date.available2014-12-08T15:42:16Z
dc.date.issued2002-07-01en_US
dc.description.abstractMany process capability indices, including C-p, C-pk, and C-pm, have been proposed to provide numerical measures on the process potential and performance. Combining the advantages of these indices, Pearn et al. (1992) introduced a new capability index called C-pmk, which has been shown to be a useful capability index for processes with two-sided specification limits. In this paper, we implement the theory of a testing hypothesis using the natural estimator of C-pmk, and provide an efficient Maple computer program to calculate the p-values. We also provide tables of the critical values for some commonly used capability requirements. Based on the test we develop a simple step-by-step procedure for in-plant applications. The practitioners can use the proposed procedure to determine whether their process meets the preset capability requirement, and make reliable decisions. Copyright (C) 2002 John Wiley Sons, Ltd.en_US
dc.identifier.doi10.1002/qre.465en_US
dc.identifier.issn0748-8017en_US
dc.identifier.journalQUALITY AND RELIABILITY ENGINEERING INTERNATIONALen_US
dc.identifier.urihttp://dx.doi.org/10.1002/qre.465en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/28692
dc.identifier.wosnumberWOS:000177486000008
dc.language.isoen_USen_US
dc.subjectprocess capability indexen_US
dc.subjecttesting hypothesisen_US
dc.subjectcritical valueen_US
dc.subjectp-valueen_US
dc.titleComputer program for calculating the p-value in testing process capability index C-pmken_US
dc.typeArticleen_US

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