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Reducing Fault Dictionary Size for Million-Gate Large Circuits

dc.citation.issue2en_US
dc.citation.volume14en_US
dc.citation.woscount1
dc.contributor.authorHong, Yu-Ruen_US
dc.contributor.authorHuang, Juinn-Daren_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:10:28Z
dc.date.available2014-12-08T15:10:28Z
dc.date.issued2009en_US
dc.description.abstractIn general, fault dictionary is prevented from practical applications in fault diagnosis due to its extremely large size. Several previous works are proposed for the fault dictionary size reduction. However, some of them fail to bring down the size to an acceptable level, and others might not be able to handle today's million-gate circuits due to their high time and space complexity. In this article, an algorithm is presented to reduce the size of pass-fail dictionary while still preserving high diagnostic resolution. The proposed algorithm possesses low time and space complexity by avoiding constructing the huge distinguishability table, which inevitably boosts up the required computation complexity. Experimental results demonstrate that the proposed algorithm is capable of handling industrial million-gate large circuits in a reasonable amount of runtime and memory.en_US
dc.identifier.doi10.1145/1497561.1497570en_US
dc.identifier.issn1084-4309en_US
dc.identifier.journalACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMSen_US
dc.identifier.urihttp://dx.doi.org/10.1145/1497561.1497570en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/7995
dc.identifier.wosnumberWOS:000266014400009
dc.language.isoen_USen_US
dc.subjectAlgorithmsen_US
dc.subjectReliabilityen_US
dc.subjectFault dictionaryen_US
dc.subjectfault diagnosisen_US
dc.subjectdiagnostic resolutionen_US
dc.titleReducing Fault Dictionary Size for Million-Gate Large Circuitsen_US
dc.typeArticleen_US

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