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Unique approach to measuring temperature variation of surface tension in smectic liquid crystals

dc.citation.epage5155en_US
dc.citation.issue12en_US
dc.citation.spage5151en_US
dc.citation.volume74en_US
dc.citation.woscount6
dc.contributor.authorVeum, Men_US
dc.contributor.authorMessman, Pen_US
dc.contributor.authorLiu, ZQen_US
dc.contributor.authorHuang, CCen_US
dc.contributor.authorJanarthanan, Nen_US
dc.contributor.authorHsu, CSen_US
dc.contributor.department應用化學系zh_TW
dc.contributor.departmentDepartment of Applied Chemistryen_US
dc.date.accessioned2014-12-08T15:40:00Z
dc.date.available2014-12-08T15:40:00Z
dc.date.issued2003-12-01en_US
dc.description.abstractWe have measured the temperature variation of surface tension, sigma, in freestanding films of three liquid-crystal compounds. To do so, we have constructed a curvature-pressure tensiometer that uses a feedback loop to hold constant the curvature of a film while the temperature of the system is smoothly ramped. The apparatus enables us to obtain the temperature variation of sigma in a continuous manner with resolution in sigma of similar to0.2%. We interpret reproducible features of our data in terms of phase transitions. (C) 2003 American Institute of Physics.en_US
dc.identifier.doi10.1063/1.1623629en_US
dc.identifier.issn0034-6748en_US
dc.identifier.journalREVIEW OF SCIENTIFIC INSTRUMENTSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.1623629en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/27330
dc.identifier.wosnumberWOS:000186755400026
dc.language.isoen_USen_US
dc.titleUnique approach to measuring temperature variation of surface tension in smectic liquid crystalsen_US
dc.typeArticleen_US

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