Dependence of Photosensitive Effect on the Defects Created by DC Stress for LTPS TFTs
| dc.citation.epage | 1324 | en_US |
| dc.citation.issue | 12 | en_US |
| dc.citation.spage | 1322 | en_US |
| dc.citation.volume | 29 | en_US |
| dc.citation.woscount | 6 | |
| dc.contributor.author | Tai, Ya-Hsiang | en_US |
| dc.contributor.author | Kuo, Yan-Fu | en_US |
| dc.contributor.author | Lee, Yun-Hsiang | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | 顯示科技研究所 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.contributor.department | Institute of Display | en_US |
| dc.date.accessioned | 2014-12-08T15:10:35Z | |
| dc.date.available | 2014-12-08T15:10:35Z | |
| dc.date.issued | 2008-12-01 | en_US |
| dc.description.abstract | In this letter, the photosensitive effect of n-type low-temperature polycrystalline silicon (LTPS) thin-film transistors (TFTs) after dc stress was investigated. It was discovered that the photo-generated carrier behaviors under optical illumination are related to defect types created by different stress conditions of hot-carrier effect and self-heating effect. These two types of defect creation result in the different photosensitivity behaviors of LTPS TFT. A model considering the relation between photosensitivity and defect is proposed to explain the anomalous illumination behaviors after device degradation. | en_US |
| dc.identifier.doi | 10.1109/LED.2008.2006414 | en_US |
| dc.identifier.issn | 0741-3106 | en_US |
| dc.identifier.journal | IEEE ELECTRON DEVICE LETTERS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1109/LED.2008.2006414 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/8086 | |
| dc.identifier.wosnumber | WOS:000262062000011 | |
| dc.language.iso | en_US | en_US |
| dc.subject | DC stress | en_US |
| dc.subject | leakage current | en_US |
| dc.subject | photosensitivity | en_US |
| dc.subject | poly-Si thin-film transistor (TFT) | en_US |
| dc.title | Dependence of Photosensitive Effect on the Defects Created by DC Stress for LTPS TFTs | en_US |
| dc.type | Article | en_US |