Measurement of wavelength shift by using surface plasmon resonance heterodyne interferometry
| dc.citation.epage | 172 | en_US |
| dc.citation.issue | 1-3 | en_US |
| dc.citation.spage | 167 | en_US |
| dc.citation.volume | 209 | en_US |
| dc.citation.woscount | 23 | |
| dc.contributor.author | Chen, KH | en_US |
| dc.contributor.author | Hsu, CC | en_US |
| dc.contributor.author | Su, DC | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:42:08Z | |
| dc.date.available | 2014-12-08T15:42:08Z | |
| dc.date.issued | 2002-08-01 | en_US |
| dc.description.abstract | A linearly polarized light is incident on a surface plasmon resonance (SPR) apparatus at the resonant angle. the surface plasmons are excited, Small wavelength shifts will introduce phase difference variations between s- and p-polarizations of the reflected light. These phase difference variations can be measured accurately by using heterodyne interferometry. Based on these facts, a novel method for measuring small wavelength shifts is proposed. It has the advantages of both common-path interferometry and heterodyne interferometry. (C) 2002 Elsevier Science B.V. All rights reserved. | en_US |
| dc.identifier.doi | 10.1016/S0030-4018(02)01641-3 | en_US |
| dc.identifier.issn | 0030-4018 | en_US |
| dc.identifier.journal | OPTICS COMMUNICATIONS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1016/S0030-4018(02)01641-3 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/28618 | |
| dc.identifier.wosnumber | WOS:000177194400018 | |
| dc.language.iso | en_US | en_US |
| dc.title | Measurement of wavelength shift by using surface plasmon resonance heterodyne interferometry | en_US |
| dc.type | Article | en_US |