Improved technique for measuring small angles
| dc.citation.epage | 7106 | en_US |
| dc.citation.issue | 28 | en_US |
| dc.citation.spage | 7104 | en_US |
| dc.citation.volume | 36 | en_US |
| dc.contributor.author | Chiu, MH | en_US |
| dc.contributor.author | Su, DC | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:01:25Z | |
| dc.date.available | 2014-12-08T15:01:25Z | |
| dc.date.issued | 1997-10-01 | en_US |
| dc.description.abstract | Based on the total-internal-reflection effect and heterodyne interferometry, an improved technique for measuring small angles is proposed. This technique not only expands the measurement range but it also improves measurement performances. Its validity is demonstrated. (C) 1997 Optical Society of America. | en_US |
| dc.identifier.issn | 0003-6935 | en_US |
| dc.identifier.journal | APPLIED OPTICS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/270 | |
| dc.language.iso | en_US | en_US |
| dc.subject | total-internal-reflection effect | en_US |
| dc.subject | heterodyne interferometry | en_US |
| dc.title | Improved technique for measuring small angles | en_US |
| dc.type | Article | en_US |