Improved Electrical Characteristics and Reliability of Multi-Stacking PNPN Junctionless Transistors Using Channel Depletion Effect
| dc.citation.epage | 48 | en_US |
| dc.citation.spage | 47 | en_US |
| dc.contributor.author | Lin, Ming-Huei | en_US |
| dc.contributor.author | Shih, Yi-Jia | en_US |
| dc.contributor.author | Liu, Chien | en_US |
| dc.contributor.author | Chiu, Yu-Chien | en_US |
| dc.contributor.author | Fan, Chia-Chi | en_US |
| dc.contributor.author | Liou, Guan-Lin | en_US |
| dc.contributor.author | Cheng, Chun-Hu | en_US |
| dc.contributor.author | Chang, Chun-Yen | en_US |
| dc.contributor.department | 電子物理學系 | zh_TW |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electrophysics | en_US |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2018-08-21T05:57:00Z | |
| dc.date.available | 2018-08-21T05:57:00Z | |
| dc.date.issued | 2017-01-01 | en_US |
| dc.description.abstract | This work demonstrates a novel multi-stacking PNPN channel structure for nanowire junctionless transistor. With the multi-PNPN channel structure, the design of multi-stacking PNPN junctions can promote the p-type channel layer to achieve fully depleted channel, accompanied with the excellent electrical performances on a steep subthreshold swing of 77 mV/dec and a high on/off current ratio of >10(7). Besides, utilizing with the constant-voltage-stress measurement, the multi-PNPN channel junctionless FETs with a robust stress reliability was demonstrated. | en_US |
| dc.identifier.issn | 2161-4636 | en_US |
| dc.identifier.journal | 2017 SILICON NANOELECTRONICS WORKSHOP (SNW) | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/146934 | |
| dc.identifier.wosnumber | WOS:000425209200024 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Improved Electrical Characteristics and Reliability of Multi-Stacking PNPN Junctionless Transistors Using Channel Depletion Effect | en_US |
| dc.type | Proceedings Paper | en_US |
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