Radiometric temperature measurement with Si and InGaAs single-photon avalanche photodiode
| dc.citation.epage | 5518 | en_US |
| dc.citation.issue | 19 | en_US |
| dc.citation.spage | 5515 | en_US |
| dc.citation.volume | 39 | en_US |
| dc.citation.woscount | 0 | |
| dc.contributor.author | Wu, J. -Y. | en_US |
| dc.contributor.author | Lu, P. -K. | en_US |
| dc.contributor.author | Hsiao, Y. -J. | en_US |
| dc.contributor.author | Lin, S. -D. | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:36:56Z | |
| dc.date.available | 2014-12-08T15:36:56Z | |
| dc.date.issued | 2014-10-01 | en_US |
| dc.description.abstract | We experimentally demonstrate the use of single-photon avalanche photodiode (SPAD) for radiometric temperature measurement. The low dark count rate CMOS SPAD and a commercial InGaAs/InP SPAD can detect the thermal radiation from a blackbody down to the temperatures of 510 and 405 K, respectively. Our work shows that current SPADs are cost-effective thermal sensors for various applications. (C) 2014 Optical Society of America | en_US |
| dc.identifier.doi | 10.1364/OL.39.005515 | en_US |
| dc.identifier.issn | 0146-9592 | en_US |
| dc.identifier.journal | OPTICS LETTERS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1364/OL.39.005515 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/25345 | |
| dc.identifier.wosnumber | WOS:000343906400012 | |
| dc.language.iso | en_US | en_US |
| dc.title | Radiometric temperature measurement with Si and InGaAs single-photon avalanche photodiode | en_US |
| dc.type | Article | en_US |
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