Interface resistance and transparency in ferromagnet/superconductor Co/NbxTi1-x multilayers (x = 1, 0.6, and 0.4)
| dc.citation.epage | en_US | |
| dc.citation.issue | 2 | en_US |
| dc.citation.volume | 76 | en_US |
| dc.citation.woscount | 5 | |
| dc.contributor.author | Huang, S.-Y. | en_US |
| dc.contributor.author | Lee, S. F. | en_US |
| dc.contributor.author | Hsu, S. Y. | en_US |
| dc.contributor.author | Yao, Y. D. | en_US |
| dc.contributor.department | 電子物理學系 | zh_TW |
| dc.contributor.department | Department of Electrophysics | en_US |
| dc.date.accessioned | 2014-12-08T15:13:41Z | |
| dc.date.available | 2014-12-08T15:13:41Z | |
| dc.date.issued | 2007-07-01 | en_US |
| dc.description.abstract | The quantitative interface resistance between polycrystalline ferromagnetic Co and NbxTi1-x, with x=1, 0.6, and 0.4, is measured and analyzed at 4.2 K. Both the superconducting and normal states of NbxTi1-x, respectively, above and below the superconducting critical thickness, are studied with current flowing perpendicular to the interface. A one-band series-resistance model is used to analyze our data. The interface transparencies in terms of the ratio between interface resistance and various physical quantities are discussed. | en_US |
| dc.identifier.doi | 10.1103/PhysRevB.76.024521 | en_US |
| dc.identifier.issn | 1098-0121 | en_US |
| dc.identifier.journal | PHYSICAL REVIEW B | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1103/PhysRevB.76.024521 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/10579 | |
| dc.identifier.wosnumber | WOS:000248496200114 | |
| dc.language.iso | en_US | en_US |
| dc.title | Interface resistance and transparency in ferromagnet/superconductor Co/NbxTi1-x multilayers (x = 1, 0.6, and 0.4) | en_US |
| dc.type | Article | en_US |
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