THE SPREADING RESISTANCE ERROR IN THE VERTICAL KELVIN TEST RESISTOR STRUCTURE FOR THE SPECIFIC CONTACT RESISTIVITY

dc.citation.epage523en_US
dc.citation.issue4en_US
dc.citation.spage521en_US
dc.citation.volume35en_US
dc.citation.woscount2
dc.contributor.authorLEE, CLen_US
dc.contributor.authorYANG, WLen_US
dc.contributor.authorLEI, TFen_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.date.accessioned2014-12-08T15:06:00Z
dc.date.available2014-12-08T15:06:00Z
dc.date.issued1988-04-01en_US
dc.identifier.doi10.1109/16.2489en_US
dc.identifier.issn0018-9383en_US
dc.identifier.journalIEEE TRANSACTIONS ON ELECTRON DEVICESen_US
dc.identifier.urihttp://dx.doi.org/10.1109/16.2489en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/4540
dc.identifier.wosnumberWOS:A1988M528600019
dc.language.isoen_USen_US
dc.titleTHE SPREADING RESISTANCE ERROR IN THE VERTICAL KELVIN TEST RESISTOR STRUCTURE FOR THE SPECIFIC CONTACT RESISTIVITYen_US
dc.typeNoteen_US

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