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STUDY OF ELECTRICAL CHARACTERISTICS ON THERMALLY NITRIDED SIO2 (NITROXIDE) FILMS

dc.citation.epage877en_US
dc.citation.issue4en_US
dc.citation.spage875en_US
dc.citation.volume131en_US
dc.citation.woscount41
dc.contributor.authorCHEN, CTen_US
dc.contributor.authorTSENG, FCen_US
dc.contributor.authorCHANG, CYen_US
dc.contributor.authorLEE, MKen_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.date.accessioned2014-12-08T15:06:17Z
dc.date.available2014-12-08T15:06:17Z
dc.date.issued1984en_US
dc.identifier.issn0013-4651en_US
dc.identifier.journalJOURNAL OF THE ELECTROCHEMICAL SOCIETYen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/4869
dc.identifier.wosnumberWOS:A1984SL25600036
dc.language.isoen_USen_US
dc.titleSTUDY OF ELECTRICAL CHARACTERISTICS ON THERMALLY NITRIDED SIO2 (NITROXIDE) FILMSen_US
dc.typeArticleen_US

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