SYSTEM RELIABILITY-DESIGN WITH DETERIORATIVE COMPONENTS
| dc.citation.epage | 58 | en_US |
| dc.citation.issue | 1 | en_US |
| dc.citation.spage | 43 | en_US |
| dc.citation.volume | 28 | en_US |
| dc.citation.woscount | 0 | |
| dc.contributor.author | JAN, RH | en_US |
| dc.contributor.author | CHERN, MS | en_US |
| dc.contributor.department | 資訊工程學系 | zh_TW |
| dc.contributor.department | Department of Computer Science | en_US |
| dc.date.accessioned | 2014-12-08T15:06:01Z | |
| dc.date.available | 2014-12-08T15:06:01Z | |
| dc.date.issued | 1988 | en_US |
| dc.identifier.issn | 0026-2714 | en_US |
| dc.identifier.journal | MICROELECTRONICS AND RELIABILITY | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/4581 | |
| dc.identifier.wosnumber | WOS:A1988L467700008 | |
| dc.language.iso | en_US | en_US |
| dc.title | SYSTEM RELIABILITY-DESIGN WITH DETERIORATIVE COMPONENTS | en_US |
| dc.type | Article | en_US |
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