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學術出版;;Publications
會議論文;;Conferences Paper
DC and AC NBTI stresses in pMOSFETs with PE-SiN capping
DC and AC NBTI stresses in pMOSFETs with PE-SiN capping
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000240855800160.pdf
(130.26 KB)
Date
2006
Authors
Lu, Chia-Yu
Lin, Horng-Chih
Chang, Yi-Feng
Huang, Tiao-Yuan
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DOI
10.1109/RELPHY.2006.251345
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http://dx.doi.org/10.1109/RELPHY.2006.251345
https://ir.lib.nycu.edu.tw/handle/11536/17482
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會議論文;;Conferences Paper
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