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Gate-All-Around Poly-Si TFTs With Single-Crystal-Like Nanowire Channels

dc.citation.epage1241en_US
dc.citation.issue9en_US
dc.citation.spage1239en_US
dc.citation.volume32en_US
dc.citation.woscount5
dc.contributor.authorKang, Tsung-Kueien_US
dc.contributor.authorLiao, Ta-Chuanen_US
dc.contributor.authorLin, Chia-Minen_US
dc.contributor.authorLiu, Han-Wenen_US
dc.contributor.authorWang, Fang-Hsingen_US
dc.contributor.authorCheng, Huang-Chungen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:27:28Z
dc.date.available2014-12-08T15:27:28Z
dc.date.issued2011-09-01en_US
dc.description.abstractThe gate-all-around (GAA) poly-Si thin-film transistors (TFTs) with single-crystal-like nanowire (NW) channels (SCLNCs) are demonstrated and characterized. Via the nanoscale nitride spacer, the Si NW can be easily transformed within one crystalline grain of the two-shot sequential-lateral-solidification poly-Si film. As compared with the planar ones, the GAA-SCLNC TFTs showed more excellent characteristics. The results clearly show that the variations of device characteristics can be reduced by increasing the numbers of NWs in the channels and an average mobility above 410 cm(2)/V . s with a low standard deviation can be achieved for the GAA-SCLNC TFTs with 20-NW channels.en_US
dc.identifier.doi10.1109/LED.2011.2160146en_US
dc.identifier.issn0741-3106en_US
dc.identifier.journalIEEE ELECTRON DEVICE LETTERSen_US
dc.identifier.urihttp://dx.doi.org/10.1109/LED.2011.2160146en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/19737
dc.identifier.wosnumberWOS:000294171600025
dc.language.isoen_USen_US
dc.subjectField-effect mobilityen_US
dc.subjectgate-all-around (GAA)en_US
dc.subjectnanowire (NW)en_US
dc.subjectnitride spaceren_US
dc.subjectsequential lateral solidification (SLS)en_US
dc.subjectsingle-crystalline-likeen_US
dc.titleGate-All-Around Poly-Si TFTs With Single-Crystal-Like Nanowire Channelsen_US
dc.typeArticleen_US

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