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Atomic-scale epitaxial aluminum film on GaAs substrate

dc.citation.epage0en_US
dc.citation.issue7en_US
dc.citation.spage0en_US
dc.citation.volume7en_US
dc.citation.woscount2en_US
dc.contributor.authorFan, Yen-Tingen_US
dc.contributor.authorLo, Ming-Chengen_US
dc.contributor.authorWu, Chu-Chunen_US
dc.contributor.authorChen, Peng-Yuen_US
dc.contributor.authorWu, Jenq-Shinnen_US
dc.contributor.authorLiang, Chi-Teen_US
dc.contributor.authorLin, Sheng-Dien_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2019-04-03T06:43:05Z
dc.date.available2019-04-03T06:43:05Z
dc.date.issued2017-07-01en_US
dc.description.abstractAtomic-scale metal films exhibit intriguing size-dependent film stability, electrical conductivity, superconductivity, and chemical reactivity. With advancing methods for preparing ultra-thin and atomically smooth metal films, clear evidences of the quantum size effect have been experimentally collected in the past two decades. However, with the problems of small-area fabrication, film oxidation in air, and highly-sensitive interfaces between the metal, substrate, and capping layer, the uses of the quantized metallic films for further ex-situ investigations and applications have been seriously limited. To this end, we develop a large-area fabrication method for continuous atomic-scale aluminum film. The self-limited oxidation of aluminum protects and quantizes the metallic film and enables ex-situ characterizations and device processing in air. Structure analysis and electrical measurements on the prepared films imply the quantum size effect in the atomic-scale aluminum film. Our work opens the way for further physics studies and device applications using the quantized electronic states in metals. (C) 2017 Author(s).en_US
dc.identifier.doi10.1063/1.4991435en_US
dc.identifier.issn2158-3226en_US
dc.identifier.journalAIP ADVANCESen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.4991435en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/145866
dc.identifier.wosnumberWOS:000406760200051en_US
dc.language.isoen_USen_US
dc.titleAtomic-scale epitaxial aluminum film on GaAs substrateen_US
dc.typeArticleen_US

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