Scaling down of cobalt quantum-dots by colloidal route for non-volatile memory device application
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DOI
10.1049/mnl.2019.0148
Abstract
The present work details the synthesis of cobalt quantum-dots (Co QDs) with size downscaling to 1-2 nm and their applications in non-volatile memory (NVM) devices. The process of colloidal synthesis is simple and provides the control over a wide range of QDs size. The scaled-down colloidal Co QDs are applied for the NVM device fabrication. Colloidal synthesised Co QDs are spin-coated over silicon dioxide wafer for the fabrication of floating-gate NVM devices. Capacitance-voltage (C-V) and capacitance-time (C-t) measurements of the fabricated NVM device indicate a low voltage operation of device. A sweep voltages as small as 1.2-4 V lead to a flat band voltage shift of 0.35-1.5 V, evidencing the low operating voltage and low power NVM applications. Further, retention characteristics show a robust retention by fabricated NVM device. In addition, C-V measurements are done for the several samples in order to study the process repeatability. The work also is compared with the other processes for the floating gate memory device.
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Keywords
semiconductor quantum dots , colloids , silicon compounds , random-access storage , integrated circuit measurement , low-power electronics , cobalt , SiO2 , Co , voltage 0 , 35 V to 4 , 0 V , size 1 , 0 nm to 2 , 0 nm , retention characteristics , C-t measurements , capacitance-time measurements , C-V measurements , capacitance-voltage measurements , floating-gate NVM device fabrication , scaled-down colloidal cobalt QDs , cobalt quantum-dot synthesis , floating gate memory device , low power NVM applications , sweep voltages , nonvolatile memory device application , colloidal route