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GaN-based photonic crystal surface emitting lasers with central defects

dc.citation.epageen_US
dc.citation.issue22en_US
dc.citation.volume99en_US
dc.citation.woscount6
dc.contributor.authorWu, Tzeng-Tsongen_US
dc.contributor.authorWeng, Peng-Hsiangen_US
dc.contributor.authorHou, Yen-Juen_US
dc.contributor.authorLu, Tien-Changen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:21:13Z
dc.date.available2014-12-08T15:21:13Z
dc.date.issued2011-11-28en_US
dc.description.abstractThe GaN-based photonic crystal surface emitting lasers (PCSELs) with different central defects were fabricated and investigated. The threshold energy densities increased from 3.23 to 3.51 mJ/cm(2) when the central defect size increased. In addition, lasing wavelengths decreased from 400 nm to 390 nm due to the guided mode shifting phenomenon for the PCSEL cavities with larger central defects. The tendency of threshold gain and resonance wavelength for PCSELs with different central defects were calculated by the multiple scattering method and well matched to the experimental results. (C) 2011 American Institute of Physics. [doi:10.1063/1.3665251]en_US
dc.identifier.doi10.1063/1.3665251en_US
dc.identifier.issn0003-6951en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.3665251en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/15057
dc.identifier.wosnumberWOS:000298244500005
dc.language.isoen_USen_US
dc.titleGaN-based photonic crystal surface emitting lasers with central defectsen_US
dc.typeArticleen_US

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