Testable design and testing of MCMs based on multifrequency scan
| dc.citation.epage | 80 | en_US |
| dc.citation.spage | 75 | en_US |
| dc.contributor.author | Tseng, WD | en_US |
| dc.contributor.author | Wang, KC | en_US |
| dc.contributor.department | 資訊工程學系 | zh_TW |
| dc.contributor.department | Department of Computer Science | en_US |
| dc.date.accessioned | 2014-12-08T15:27:35Z | |
| dc.date.available | 2014-12-08T15:27:35Z | |
| dc.date.issued | 1996 | en_US |
| dc.identifier.isbn | 0-8186-7478-4 | en_US |
| dc.identifier.journal | PROCEEDINGS OF THE FIFTH ASIAN TEST SYMPOSIUM (ATS '96) | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/19838 | |
| dc.identifier.wosnumber | WOS:A1996BG49W00013 | |
| dc.language.iso | en_US | en_US |
| dc.title | Testable design and testing of MCMs based on multifrequency scan | en_US |
| dc.type | Proceedings Paper | en_US |
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