Recombination dynamics and carrier lifetimes in highly mismatched ZnTeO alloys
| dc.citation.epage | en_US | |
| dc.citation.issue | 26 | en_US |
| dc.citation.volume | 103 | en_US |
| dc.citation.woscount | 1 | |
| dc.contributor.author | Lin, Yan-Cheng | en_US |
| dc.contributor.author | Tasi, Ming-Jui | en_US |
| dc.contributor.author | Chou, Wu-Ching | en_US |
| dc.contributor.author | Chang, Wen-Hao | en_US |
| dc.contributor.author | Chen, Wei-Kuo | en_US |
| dc.contributor.author | Tanaka, Tooru | en_US |
| dc.contributor.author | Guo, Qixin | en_US |
| dc.contributor.author | Nishio, Mitsuhiro | en_US |
| dc.contributor.department | 電子物理學系 | zh_TW |
| dc.contributor.department | Department of Electrophysics | en_US |
| dc.date.accessioned | 2014-12-08T15:34:38Z | |
| dc.date.available | 2014-12-08T15:34:38Z | |
| dc.date.issued | 2013-12-23 | en_US |
| dc.description.abstract | This study investigates the recombination dynamics in highly mismatched ZnTeO alloys using time-resolved photoluminescence (PL) spectroscopy. The large PL energy redshift with increasing O content and the disappearance of the ZnTe emission verify the O-induced conduction band anticrossing effect. The incorporation of O generates electron localization below the E_ conduction subband tail, which provide additional optical transitions and cause complex recombination mechanisms. Photoexcited free electrons in both the E+ and the E- conduction subbands favor rapid relaxation to low energy states. Additionally, temperature-independent long carrier lifetimes (>130.0 ns) that are induced by localized electrons increase with O concentration. (C) 2013 AIP Publishing LLC. | en_US |
| dc.identifier.doi | 10.1063/1.4858968 | en_US |
| dc.identifier.issn | 0003-6951 | en_US |
| dc.identifier.journal | APPLIED PHYSICS LETTERS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1063/1.4858968 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/23646 | |
| dc.identifier.wosnumber | WOS:000329977400023 | |
| dc.language.iso | en_US | en_US |
| dc.title | Recombination dynamics and carrier lifetimes in highly mismatched ZnTeO alloys | en_US |
| dc.type | Article | en_US |