應用良率分析於生產不同積體電路產品之生產線製造績效評估之研究
| dc.contributor.author | 唐麗英 | en_US |
| dc.contributor.author | TONG LEE-ING | en_US |
| dc.contributor.department | 交通大學工業工程與管理系 | zh_TW |
| dc.date.accessioned | 2014-12-13T10:37:31Z | |
| dc.date.available | 2014-12-13T10:37:31Z | |
| dc.date.issued | 1999 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC88-2213-E009-033 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=460934&docId=84442 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/94708 | |
| dc.language.iso | zh_TW | en_US |
| dc.subject | 積體電路 | zh_TW |
| dc.subject | 良率分析 | zh_TW |
| dc.subject | 績效評估 | zh_TW |
| dc.subject | 修正卜松模式 | zh_TW |
| dc.subject | Integrated circuit (IC) | en_US |
| dc.subject | Yield analysis | en_US |
| dc.subject | Performance evaluation | en_US |
| dc.subject | Modified Poisson model | en_US |
| dc.title | 應用良率分析於生產不同積體電路產品之生產線製造績效評估之研究 | zh_TW |
| dc.title | Application of Yield Analysis on Manufacturing Performance Evaluation of Integrated Circuits Production Lines | en_US |
| dc.type | Plan | en_US |