On the distribution of the estimated process yield index S-pk
| dc.citation.epage | 116 | en_US |
| dc.citation.issue | 2 | en_US |
| dc.citation.spage | 111 | en_US |
| dc.citation.volume | 18 | en_US |
| dc.citation.woscount | 39 | |
| dc.contributor.author | Lee, JC | en_US |
| dc.contributor.author | Hung, HN | en_US |
| dc.contributor.author | Pearn, WL | en_US |
| dc.contributor.author | Kueng, TL | en_US |
| dc.contributor.department | 統計學研究所 | zh_TW |
| dc.contributor.department | 工業工程與管理學系 | zh_TW |
| dc.contributor.department | Institute of Statistics | en_US |
| dc.contributor.department | Department of Industrial Engineering and Management | en_US |
| dc.date.accessioned | 2014-12-08T15:42:45Z | |
| dc.date.available | 2014-12-08T15:42:45Z | |
| dc.date.issued | 2002-03-01 | en_US |
| dc.description.abstract | This paper considers an asymptotic distribution for an estimate (S) over cap (pk) of the process yield index S-pk proposed by Boyles (1994). The asymptotic distribution of (S) over cap (pk) is useful in statistical inferences for S-pk. An illustrative example is given for hypothesis testing and for interval estimation on the yield index S-pk. Copyright (C) 2002 John Wiley Sons, Ltd. | en_US |
| dc.identifier.doi | 10.1002/qre.450 | en_US |
| dc.identifier.issn | 0748-8017 | en_US |
| dc.identifier.journal | QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1002/qre.450 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/28973 | |
| dc.identifier.wosnumber | WOS:000174981800004 | |
| dc.language.iso | en_US | en_US |
| dc.subject | central limit theorem | en_US |
| dc.subject | illustrative example | en_US |
| dc.subject | normal distribution | en_US |
| dc.title | On the distribution of the estimated process yield index S-pk | en_US |
| dc.type | Article | en_US |