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Observations of Guinier-Preston zones in an As-deposited Al-1wt.%Si-0.5wt.%Cu thin film

dc.citation.epage1477en_US
dc.citation.spage1473en_US
dc.citation.volume34en_US
dc.citation.woscount0en_US
dc.contributor.authorTung, CHen_US
dc.contributor.authorChiu, RLen_US
dc.contributor.authorChang, PHen_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2019-04-02T05:59:25Z
dc.date.available2019-04-02T05:59:25Z
dc.date.issued1996-05-01en_US
dc.identifier.doi10.1016/1359-6462(96)00004-8en_US
dc.identifier.issn1359-6462en_US
dc.identifier.journalSCRIPTA MATERIALIAen_US
dc.identifier.urihttp://dx.doi.org/10.1016/1359-6462(96)00004-8en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/149170
dc.identifier.wosnumberWOS:A1996UD55700022en_US
dc.language.isoen_USen_US
dc.titleObservations of Guinier-Preston zones in an As-deposited Al-1wt.%Si-0.5wt.%Cu thin filmen_US
dc.typeArticleen_US

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