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GENERAL EXPERIMENTAL-METHOD OF PARAMETER EXTRACTION FOR CMOS TIMING MACROMODELS

dc.citation.epage47en_US
dc.citation.issue2en_US
dc.citation.spage39en_US
dc.citation.volume135en_US
dc.citation.woscount1
dc.contributor.authorWU, CYen_US
dc.contributor.authorJANG, WYen_US
dc.contributor.authorWU, HJen_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.date.accessioned2014-12-08T15:06:00Z
dc.date.available2014-12-08T15:06:00Z
dc.date.issued1988-04-01en_US
dc.identifier.issn0956-3776en_US
dc.identifier.journalIEE PROCEEDINGS-I COMMUNICATIONS SPEECH AND VISIONen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/4543
dc.identifier.wosnumberWOS:A1988M997800003
dc.language.isoen_USen_US
dc.titleGENERAL EXPERIMENTAL-METHOD OF PARAMETER EXTRACTION FOR CMOS TIMING MACROMODELSen_US
dc.typeArticleen_US

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